Scanning Probe Microscopy in Nanoscience and Nanotechnology 3 [electronic resource] / edited by Bharat Bhushan.

Contributor(s): Bhushan, Bharat [editor.] | SpringerLink (Online service)Material type: TextTextSeries: NanoScience and Technology: Publisher: Berlin, Heidelberg : Springer Berlin Heidelberg : Imprint: Springer, 2013Description: XX, 630 p. 373 illus., 269 illus. in color. online resourceContent type: text Media type: computer Carrier type: online resourceISBN: 9783642254147Subject(s): Physics | Nanoscale science | Nanoscience | Nanostructures | Nanotechnology | Biomedical engineering | Biomaterials | Materials science | Physics | Nanoscale Science and Technology | Nanotechnology | Nanotechnology and Microengineering | Biomedical Engineering | Biomaterials | Characterization and Evaluation of MaterialsAdditional physical formats: Printed edition:: No titleDDC classification: 620.5 LOC classification: QC176.8.N35T174.7Online resources: Texto completo
Contents:
Part 1: Scanning probe microscopy techniques- Spectroscopic techniques in SPM- High speed AFM imaging -- New developments in imaging of biological samples -- New developments in AFM -- SNOM -- Part 2: Nanocharacterization -- Antibodies for protein recognition -- In-situ imaging of living cells -- In-situ crystallization of wax materials -- Part 3: Biomimetics and industrial applications -- Electrowetting and switchable hydrophobicity -- Renewable energy applications -- AFMs in hard disk industry.
In: Springer eBooksSummary: This book presents the physical and technical foundation of the state of the art in applied scanning probe techniques. It constitutes a timely and comprehensive overview of SPM applications. The chapters in this volume relate to scanning probe microscopy techniques, characterization of various materials and structures and typical industrial applications, including topographic and dynamical surface studies of thin-film semiconductors, polymers, paper, ceramics, and magnetic and biological materials. The chapters are written by leading researchers and application scientists from all over the world and from various industries to provide a broader perspective.
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Springer (Colección 2013) Springer (Colección 2013) BIBLIOTECA GENERAL
Química y Ciencias de Materiales Química y Ciencias de Materiales (Browse shelf) Available
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Part 1: Scanning probe microscopy techniques- Spectroscopic techniques in SPM- High speed AFM imaging -- New developments in imaging of biological samples -- New developments in AFM -- SNOM -- Part 2: Nanocharacterization -- Antibodies for protein recognition -- In-situ imaging of living cells -- In-situ crystallization of wax materials -- Part 3: Biomimetics and industrial applications -- Electrowetting and switchable hydrophobicity -- Renewable energy applications -- AFMs in hard disk industry.

This book presents the physical and technical foundation of the state of the art in applied scanning probe techniques. It constitutes a timely and comprehensive overview of SPM applications. The chapters in this volume relate to scanning probe microscopy techniques, characterization of various materials and structures and typical industrial applications, including topographic and dynamical surface studies of thin-film semiconductors, polymers, paper, ceramics, and magnetic and biological materials. The chapters are written by leading researchers and application scientists from all over the world and from various industries to provide a broader perspective.

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